Invited lecture at DRIP XVII
Piątek, 05 Maj 2017 20:49 |
DRIP (Defect-Recognition, Imaging and Physics in Semiconductors) is an established international Conference dealing with defects in semiconducting materials and devices, in which a panel of experts and researchers have the opportunity to present and discuss their results. DRIP XVII will be held in Valladolid, Spain, 8th-12th October 2017.
One of the invited talks during this Conference will be given by our colleague Julita Smalc Koziorowska. She will present a lecture on TEM characterization of nitride quantum structures and devices
