| Name: | Profilometr HOMMEL-TESTER T8000 |
| Contact person: | dr hab. inż. Mariusz Kulczyk, prof IWC PAN, mariusz@unipress.waw.pl |
| Laboratory: | NL-1 |
| Location: | Park Innowacyjny IWC PAN, Celestynów – Lasek |
Research capabilities and technical data
The Hommel-Tester T8000 Profilometer, is a device that allows measurements to be taken both 2D (recording of surface roughness profile) and 3D (recording of surface topography). The device allows you to perform roughness, contour and 3D topography measurements. Main parameters: • maximum travel length is 60 mm (with fixed resolution of 10 nm) • adjustable speed from 0.1 to 3 mm/sec. • probes with 2 μm tip radius • measuring range of the instrument (in vertical direction) approx. ± 800 μm contact and optical heads The instrument is equipped with HommelMap Basic computer software, which enables the analysis and visualisation of the measurement data obtained. Examples of roughness parameters possible to obtain during the test: Ra – arithmetic mean deviation of the roughness profile. The most common Ra values for metal surfaces range from 0.02 μm to 3.5 μm – the lower the value, the more perfect the surface (0.02 μm = mirror smooth), Rz – height of the roughness profile according to 10 points. The highest height of the roughness profile Rz is the sum of the height of the highest profile elevation and the depth of the lowest profile depression inside the elementary section. Rp – maximum elevation of the roughness profile Rv – depth of the lowest depression of the profile