Lutz Kirste
| Organization: | Institute of High Pressure Physics |
| Thesis title: | |
| Type of degree: | Habilitacja |
| Field of science: | Natural sciences |
| Discipline of science: | Physical sciences |
| Title of the achievement: | Advanced Bragg Diffraction Imaging of Defects in GaN Substrates for High-Power Electronics |
| Language: | English |
| Supervisor: | |
| Reviewers: | Prof. dr hab. Tomasz Wojtowicz – Institute of Physics PAS, Prof. dr hab. inż. Krzysztof Wierzbanowski – AGH University of Krakow, Prof. dr hab. Radosław Przeniosło – University of Warsaw, Dr hab. Ryszard Sobierajski, prof. IF PAN – Institute of Physics PAS. |
| Defense date: | 27.08.2026, 13:00 |
| Location: | Institute of High Pressure Physics Polish Academy of Sciences 29/37 Sokołowska St., 01-142 Warsaw, Poland seminar room (2nd floor) Zoom live stream (registration is required) |
| Language of the defense or colloqium: | English |
Notification about the habilitaiton colloquium