Wysokorozdzielczy dyfraktometr rentgenowski Empyrean Panalytical

The Empyrean diffractometer equipped with a copper anode (CuKa1) X-ray source is a precision research system which, together with a 2-reflection hybrid monochromator and modular optics, allows operation in two complementary measurement modes. The first mode is classic high-resolution X-ray diffraction (HRXRD) using a standard detector and a triple Ge(220) analyzer, which is ideal for the accurate characterization of semiconductor structures, determining the thickness and composition of thin films or quantum wells, and crystal lattice parameters with the highest sensitivity. The second mode uses a modern PIXcel3D surface detector, which, thanks to its operation in 0D, 1D, and 2D dimensions, significantly reduces measurement time, enabling, among other things, rapid reverse space mapping (RSM) for advanced texture and stress studies with minimal data acquisition time.