Preparatyka próbek do transmisyjnej mikroskopii elektronowej (TEM)

We offer the preparation of specimens from both nanoparticle and bulk materials using classic mechanical and ion polishing techniques. We perform cross-sections, planar view specimens, and wedge specimens. We have a complete infrastructure for preparing specimens for TEM testing, including a K.D. Unipress WS25 wire saw, an Allied MultiPrep System mechanical polisher, and a Gatan Precision Ion Polishing System (PIPS). Specimen obtained using classical methods have relatively large areas of electron-transparent material surrounded by bulk material, which is favorable to TEM observations. These sepecimen enable the analysis of nanoscale structures while maintaining conditions similar to those prevailing in bulk material (stress, defect concentration). In addition, these techniques cause less damage to the material structure compared to preparations prepared using the Focused Ion Beam (FIB) method.