| Name: | Stanowisko mikroskopii skaningowej |
| Contact person: | Jan Mizeracki, e-mail:j.mizeracki@labnano.pl |
| Laboratory: | NL-4 |
| Location: | ul. Sokołowska 29/37 Warszawa |
Research capabilities and technical data
The station is equipped with a Zeiss Ultra Plus scanning electron microscope (SEM) designed for high-resolution observation of the morphology and topography of material surfaces. The microscope enables the analysis of structures on a micrometer and nanometer scale, allowing for detailed examination of the surfaces of powders, coatings, composites, and biological materials. The device enables the detection of topographical and material contrast, allowing for the differentiation of phases, grain boundaries, and defects in samples. Thanks to its integration with the EDS (Energy Dispersive Spectroscopy) system, elemental composition analysis is also possible. High resolution and advanced imaging modes allow for structural and qualitative studies of materials in science and industry.