Equipment

Characterization of materials and devices

THz FTIR Bruker VERTEX 80v vacuum THz spectrometer with photoluminescence module and helium flow cryostat and IRLabs Inc. D211-F/2 helium bolometer

Characterization of materials and devices

Cryogen Free helium cryostat for high pressure magnetotrasport measurements

Characterization of materials and devices

9T Superconducting Magnet (Cryogen Free - Room Temperature Bore 200 mm)

Characterization of materials and devices

THz Quantum Cascade Lasers

Characterization of materials and devices

THz Time Domain Spectrometer (TDS)

Characterization of materials and devices

Optical microscope Nicon Eclypse LV150 N

Characterization of materials and devices

FEI Tecnai G2 F20 S-TWIN Transmission Electron Microscope (200 kV)

Characterization of materials and devices

Veeco Atomic Force Microscope (AFM)

Characterization of materials and devices

Atomic force microscope (AFM) by NTMDT

Characterization of materials and devices

High-resolution X-ray diffractometer Empyrean Panalytical

Characterization of materials and devices

Measuring system for detecting deep trap states using DLTS (Deep Level Transient Spectroscopy), L-DLTS (Laplace DLTS), DLOS (Deep Level Optical Spectroscopy), and TAS (Thermal Admittance Spectroscopy) techniques

Characterization of materials and devices

Secondary Ion Mass Spectrometer CAMECA IMS 7f-Auto