Equipment

Characterization of materials and devices

Veeco Atomic Force Microscope (AFM)

Characterization of materials and devices

Atomic force microscope (AFM) by NTMDT

Characterization of materials and devices

High-resolution X-ray diffractometer Empyrean Panalytical

Characterization of materials and devices

Measuring system for detecting deep trap states using DLTS (Deep Level Transient Spectroscopy), L-DLTS (Laplace DLTS), DLOS (Deep Level Optical Spectroscopy), and TAS (Thermal Admittance Spectroscopy) techniques

Characterization of materials and devices

Secondary Ion Mass Spectrometer CAMECA IMS 7f-Auto

Characterization of materials and devices

Atomic Force Microscope AFM FX Parksystems

Fabrication of materials and structures

Electrochemical etching setup

Fabrication of materials and structures

Plasma-assisted molecular beam epitaxy machine VG90

Fabrication of materials and structures

Dual-chamber plasma-assited molecular beam epitaxy machine Veeco Gen20a