Equipment

Characterization of materials and devices

Station for testing the stability of liquid samples and assessing foam stability

Characterization of materials and devices

Station for analyzing particle size and zeta potential in liquid systems

Characterization of materials and devices

Station for analyzing the distribution of particles in liquids

Characterization of materials and devices

Scanning microscopy station

Characterization of materials and devices

Helium density measurement station

Characterization of materials and devices

Specific surface area measurement station

Characterization of materials and devices

Thermogravimetric testing station

Characterization of materials and devices

Nikon optical microscope

Characterization of materials and devices

X‑ray diffractometer (XRD)

Characterization of materials and devices

Delta Technologies X‑ray goniometer for crystal orientation (3 units)

Characterization of materials and devices

Mitutoyo surface roughness tester

Characterization of materials and devices

Bruker Atomic Force Microscope (AFM)